Mathematical modeling of infrared radiation thin layer drying of onion slices

被引:141
作者
Sharma, GP [1 ]
Verma, RC
Pathare, P
机构
[1] Maharana Pratap Univ Agr & Technol, Coll Technol & Engn, Proc & Food Engn Dept, Udaipur 313001, India
[2] CIPHET, Ludhiana, Punjab, India
关键词
infrared radiations; thin layer; drying rate; moisture-ratio models; infrared drying;
D O I
10.1016/j.jfoodeng.2005.02.010
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
An infrared dryer was developed and infrared radiation thin layer drying of onion slices was carried out at infrared power levels of 300, 400 and 500 W, air temperatures of 35, 40 and 45 degrees C and air velocities of 1.0, 1.25 and 1.5 m/s. The drying occurred in the falling rate of drying period. Drying rate increased with increase in infrared power at a given air temperature and velocity and thus reduced the drying time. The drying time increased with increase in air velocity at a given infrared power and air temperature because of the increased cooling effect at the surface of the product. Eight available moisture-ratio models were fitted to the drying data. Page's model had a higher correlation coefficient and low chi-square value and thus predicted drying behaviour of the onion slices more accurately. (c) 2005 Published by Elsevier Ltd.
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页码:282 / 286
页数:5
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