Improved thermoelectric performance of flexible p-type SiGe films by B-doped Al-induced layer exchange

被引:10
作者
Tsuji, M. [1 ]
Imajo, T. [1 ]
Saitoh, N. [2 ]
Yoshizawa, N. [2 ]
Suemasu, T. [1 ]
Toko, K. [1 ,3 ]
机构
[1] Univ Tsukuba, Inst Appl Phys, 1-1-1 Tennodai, Tsukuba, Ibaraki 3058573, Japan
[2] AIST, TIA, Electron Microscope Facil, 16-1 Onogawa, Tsukuba, Ibaraki 3058569, Japan
[3] Japan Sci & Technol Agcy, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama 3320012, Japan
关键词
SiGe-on-insulator; Al-induced layer exchange; polycrystalline film; impurity doping; thermoelectrics; ALUMINUM-INDUCED CRYSTALLIZATION; THIN-FILMS; AMORPHOUS-SILICON; GERMANIUM; ORIENTATION; THICKNESS; FIGURE; MERIT;
D O I
10.1088/1361-6463/ab5989
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Al-induced layer exchange is a useful method for the low-temperature synthesis of high-performance SiGe thermoelectric thin films. Because B has a high solid solubility in SiGe, we examined the self-organized doping of B to SiGe during layer exchange to further improve p-type thermoelectric properties. The hole concentration and the electrical conductivity were improved in the whole SiGe composition range when an appropriate amount (similar to 1%) of B to Al was added. A Si0.4Ge0.6 layer fabricated on a polyimide substrate at 350 degrees C exhibited a power factor of 240 mu W m(-1) K-2, which is best recorded as environmentally-friendly inorganic semiconductors formed on flexible substrates. The low-temperature Fermi-level-control technology for semiconductor films will exploit various flexible devices including thin-film thermoelectrics.
引用
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页数:5
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