X-ray nanotomography of SiO2-coated Pt90Ir10 tips with sub-micron conducting apex

被引：20

作者：

Rose, V. ^{[1
]}

Chien, T. Y. ^{[1
]}

Hiller, J. ^{[2
]}

Rosenmann, D. ^{[3
]}

Winarski, R. P. ^{[3
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Electron Microscopy Ctr, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

APPLIED PHYSICS LETTERS | 2011年 / 99卷 / 17期

关键词：

SCANNING TUNNELING MICROSCOPE; MEAN FREE PATHS; SYNCHROTRON-RADIATION; 50-2000-EV RANGE;

D O I：

10.1063/1.3655907

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Hard x-ray nanotomography provides an important three-dimensional view of insulator-coated "smart tips" that can be utilized for modern emerging scanning probe techniques. Tips, entirely coated by an insulating SiO2 film except at the very tip apex, are fabricated by means of electron beam physical vapor deposition, focused ion beam milling and ion beam-stimulated oxide growth. Although x-ray tomography studies confirm the structural integrity of the oxide film, transport measurements suggest the presence of defect-induced states in the SiO2 film. The development of insulator-coated tips can facilitate nanoscale analysis with electronic, chemical, and magnetic contrast by synchrotron-based scanning probe microscopy. (C) 2011 American Institute of Physics. [doi:10.1063/1.3655907]

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