Time-of-flight diffraction with multiple pulse overlap. Part I: The concept

被引:45
作者
Stuhr, U [1 ]
机构
[1] Paul Scherrer Inst, Spallat Source Div, CH-5232 Villigen, Switzerland
关键词
time-of-flight diffractometer; residual stress; strain scanner;
D O I
10.1016/j.nima.2005.01.320
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The concept of a novel type of time-of-flight diffractometer for continuous neutron sources is presented. The method is based on multiple overlapping neutron pulses and allows a tuning of the instrument to high intensity and high resolution simultaneously. The dependence of the time of flight of the neutrons on the scattering angle in combination with the different intervals between successive neutron pulses are used as extra parameters for the analysis of the frame-overlap data. The instrument concept is most suitable for strain-scanning applications where high resolution in lattice spacing is necessary although the total number of Bragg reflections is quite low. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:319 / 329
页数:11
相关论文
共 8 条
[1]  
[Anonymous], 1997, J NEUTRON RES, DOI 10.1080/10238169708200223
[2]  
Bevington R., 1969, DATA REDUCTION ERROR
[3]   EXTENDED DETECTORS IN NEUTRON TIME-OF-FLIGHT DIFFRACTION EXPERIMENTS [J].
CARPENTE.JM .
NUCLEAR INSTRUMENTS & METHODS, 1967, 47 (01) :179-&
[4]   THE DISTINCTION OF FRAME OVERLAP AND THE COHESION OF TIME-OF-FLIGHT DIFFRACTION PATTERNS COLLECTED AT VARIOUS SCATTERING ANGLES [J].
COCKCROFT, JK ;
KEARLEY, GJ .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (DEC) :464-469
[5]  
HIISMAKI P, 1972, C P IAEA VIENN, P429
[6]  
Schroder J., 1994, J NEUTRON RES, V2, P129
[7]   Time-of-flight diffraction with multiple frame overlap Part II: The strain scanner POLDI at PSI [J].
Stuhr, U ;
Spitzer, H ;
Egger, J ;
Hofer, A ;
Rasmussen, P ;
Graf, D ;
Bollhalder, A ;
Schild, M ;
Bauer, G ;
Wagner, W .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 545 (1-2) :330-338
[8]   Concept for a high-resolution, high-intensity tof-diffractometer [J].
Stuhr, U .
PHYSICA B, 1997, 241 :224-226