Deposition-rate dependence of orientation growth and crystallization of Ti thin films prepared by magnetron sputtering

被引:35
|
作者
Chen, A. Y. [1 ]
Bu, Y. [1 ]
Tang, Y. T. [1 ]
Wang, Y. [2 ]
Liu, F. [1 ]
Xie, X. F. [3 ]
Gu, J. F. [4 ]
机构
[1] Univ Shanghai Sci & Technol, Sch Mat Sci & Engn, Shanghai 200093, Peoples R China
[2] Second Mil Med Univ, Informat Ctr, Shanghai 200433, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China
[4] Shanghai Jiao Tong Univ, Sch Mat Sci & Engn, Shanghai 200030, Peoples R China
关键词
Ti thin film; Magnetron sputtering; Deposition rate; Surface morphology; Crystallinity; SURFACE-DIFFUSION; SUBSTRATE;
D O I
10.1016/j.tsf.2014.10.053
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of deposition rate on the microstructure of Ti thin films prepared by magnetron sputtering was investigated. The microstructure of Ti thin films was characterized by X-ray diffraction (XRD), scanning electron microscopy, transmission electron microscopy and atomic force microscopy. The Ti thin films exhibit a composite structure of amorphous matrix embodied with nanocrystallines. The nanocrystallization is improved with the increase of deposition rate. XRD patterns show that the crystallographic orientation transits from random distribution to (002) preferred orientation, and this crystallographic growth texture is enhanced with increasing deposition rate. Three-dimensional hexagonal particles are formed at the deposition rate of 0.35 nm/s, while flaky slices occur at the surface at larger deposition rate. Moreover, the growth process of Ti thin films controlled by the deposition rate is discussed. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:71 / 77
页数:7
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