Compton imager for detection of special nuclear material

被引:46
|
作者
Wulf, Eric A.
Phlips, Bernard F.
Johnson, W. Neil
Kurfess, James D.
Novikova, Elena I.
O'Connor, Paul
De Geronimo, Gianluigi
机构
[1] USN, Res Lab, High Energy Space Environm Branch, Washington, DC 20375 USA
[2] Brookhaven Natl Lab, Instrumentat Div, Upton, NY 11973 USA
关键词
gamma ray; Compton; silicon; SNM;
D O I
10.1016/j.nima.2007.04.085
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A Compton imager design for the detection of Special Nuclear Material (SNM), with specific focus on shielded Highly Enriched Uranium (HEU) is presented. It is based on a large field-of-view Compton gamma-ray imager that uses 24 layers of 2 mm thick, position-sensitive (1.4mm strips) silicon detectors, designed for room-temperature operation, as a scatterer and a position-sensitive NaI scintillator array as the absorber. Each layer of silicon detectors consists of double-sided silicon strip detectors daisy chained in a 3 x 3 array with a total active area of 729 cm(2). The NaI detectors are 2.9 x 2.9 cm(2) and 7.6 cm thick and will cover the bottom and sides of the instrument. Simulations of an ASIC-based readout system show that an energy resolution of 4.5keV full-width at half-maximum (FWHM) at room temperature is attainable on each daisy-chained silicon strip assuming 35 pF of capacitance and 20 nA of leakage current. Full simulations of the current instrument design are shown and are demonstrated that it can detect 8 kg of shielded HEU at 2.5m in 1 min in a realistic gamma-ray background environment. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:371 / 374
页数:4
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