Enhanced flux-pinning in dy-doped, MOD YBCO films on RABiTS

被引:15
作者
Goyal, A. [1 ]
Li, J.
Martin, P. M.
Gapud, A.
Specht, E. D.
Paranthaman, M.
Li, X.
Zhang, W.
Kodenkandath, T.
Rupich, M. W.
机构
[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[2] Univ S Alabama, Mobile, AL 36688 USA
[3] Amer Superconductor Corp, Westborough, MA 01581 USA
关键词
angular dependence; coated conductor; critical current density; flux-pinning; intergrowths; MOD films; nanodots; RABiTS; stacking faults; wires;
D O I
10.1109/TASC.2007.898957
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Significant enhancements in flux-pinning were obtained for Dy-doped, YBCO films via a metalorganic deposition (MOD) process on rolling-assisted biaxially textured substrates (RABiTS). It has been reported previously that incorporation of excess rare-earth ions during the MOD process, results in improvement of J(c) for H//c, however, a decrease in J(c) for H//ab is observed. We report here that by altering the processing conditions the reduction in the magnitude of the current peak for H//ab can be minimized while significantly enhancing the random pinning at all field orientations. The result is a YBCO film with significantly reduced anisotropy compared to the typical YBCO films prepared by the MOD process. This is accomplished by incorporating both a high density of stacking faults and (Dy, Y)(2) O-3 nanoparticles which result in the strong pinning for H//ab and a broad pinning peak for H//c respectively.
引用
收藏
页码:3340 / 3342
页数:3
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