Correlation between number of walls and diameter in multiwall carbon nanotubes grown by chemical vapor deposition

被引：62

作者：

Chiodarelli, Nicolo ^{[1
,2
]}

Richard, Olivier ^{[1
]}

Bender, Hugo ^{[1
]}

Heyns, Marc ^{[1
,3
]}

De Gendt, Stefan ^{[1
,4
]}

Groeseneken, Guido ^{[1
,2
]}

Vereecken, Philippe M. ^{[1
,5
]}

机构：

[1] Interuniv Microelect Ctr Imec, B-3001 Louvain, Belgium

[2] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Louvain, Belgium

[3] Katholieke Univ Leuven, Dept Met & Mat Engn, B-3001 Louvain, Belgium

[4] Katholieke Univ Leuven, Dept Chem, B-3001 Louvain, Belgium

[5] Katholieke Univ Leuven, Ctr Surface Chem & Catalysis, B-3001 Louvain, Belgium

来源：

CARBON | 2012年 / 50卷 / 05期

关键词：

CATALYST NANOPARTICLES; DENSITY;

D O I：

10.1016/j.carbon.2011.12.020

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We propose an empirical law correlating the average number of walls and the average diameter in a population of multi-wall carbon nanotubes grown by catalytic chemical vapor deposition. The relationship and its dispersion are derived from the statistical analysis of a database of TEM images of nanotubes collected from more than 60 publications in literature and from our group in the last years. Considering the nanotubes were grown from independent sources in a variety of conditions and tools, it has general validity. The relationship may find applicability in a wide range of fields as it provides a simple model to quickly estimate the number of walls most likely present in a population of nanotubes from only the measure of their average diameter. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：1748 / 1752

页数：5

共 20 条

[1]

Benoit JM, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.073417

[2] Electrophoretic deposition of carbon nanotubes [J].

Boccaccini, Aldo R. ;

Cho, Johann ;

Roether, Judith A. ;

Thomas, Boris J. C. ;

Minay, E. Jane ;

Shaffer, Milo S. P. .

CARBON, 2006, 44 (15) :3149-3160

[3] Integration and electrical characterization of carbon nanotube via interconnects [J].

Chiodarelli, Nicolo' ;

Li, Yunlong ;

Cott, Daire J. ;

Mertens, Sofie ;

Peys, Nick ;

Heyns, Marc ;

De Gendt, Stefan ;

Groeseneken, Guido ;

Vereecken, Philippe M. .

MICROELECTRONIC ENGINEERING, 2011, 88 (05) :837-843

[4] Measuring the electrical resistivity and contact resistance of vertical carbon nanotube bundles for application as interconnects [J].

Chiodarelli, Nicolo' ;

Masahito, Sugiura ;

Kashiwagi, Yusaku ;

Li, Yunlong ;

Arstila, Kai ;

Richard, Olivier ;

Cott, Daire J. ;

Heyns, Marc ;

De Gendt, Stefan ;

Groeseneken, Guido ;

Vereecken, Philippe M. .

NANOTECHNOLOGY, 2011, 22 (08)

[5]

Hantschel T, MAT RES SOC IN PRESS

[6] Atomic-scale imaging of wall-by-wall breakdown and concurrent transport measurements in multiwall carbon nanotubes [J].

Huang, JY ;

Chen, S ;

Jo, SH ;

Wang, Z ;

Han, DX ;

Chen, G ;

Dresselhaus, MS ;

Ren, ZF .

PHYSICAL REVIEW LETTERS, 2005, 94 (23)

[7] HELICAL MICROTUBULES OF GRAPHITIC CARBON [J].

IIJIMA, S .

NATURE, 1991, 354 (6348) :56-58

[8] Low-temperature synthesis of single-walled carbon nanotubes with a narrow diameter distribution using size-classified catalyst nanoparticles [J].

Kondo, Daiyu ;

Sato, Shintaro ;

Awano, Yuji .

CHEMICAL PHYSICS LETTERS, 2006, 422 (4-6) :481-487

[9] The weight and density of carbon nanotubes versus the number of walls and diameter [J].

Laurent, Ch. ;

Flahaut, E. ;

Peigney, A. .

CARBON, 2010, 48 (10) :2994-2996

[10] Wafer-Scale Growth and Transfer of Aligned Single-Walled Carbon Nanotubes [J].

Patil, Nishant ;

Lin, Albert ;

Myers, Edward R. ;

Ryu, Koungmin ;

Badmaev, Alexander ;

Zhou, Chongwu ;

Wong, H. -S. Philip ;

Mitra, Subhasish .

IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2009, 8 (04) :498-504

← 1 2 →