UV irradiation effects on TiO2 thin films

被引:7
|
作者
Fernandez-Rodriguez, M. [1 ]
Rico, V. J. [2 ]
Gonzalez-Elipe, A. R. [2 ]
Alvarez-Herrero, A. [1 ]
机构
[1] INTA, Lab Instrumentat Espacial, LINES, Madrid 28850, Spain
[2] CSIC Univ Sevilla, Inst Ciencias Mat Sevilla, Seville 41092, Spain
关键词
D O I
10.1002/pssc.200777790
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
This paper presents the behaviour of a standard optical coat; ing to be used in aerospace applications when exposed to ultraviolet (UV) irradiation. Ellipsometric measurements are carried out in order to monitor the effects produced on the optical properties of the TiO2 film when it is exposed to a 500 W Xenon lamp during the time intervals of l hour, 22 hours and 42 hours. The ellipsometric measurements show that main changes occur in the real part of the refractive index after the first hour of exposure to UV irradiation. To assess a possible relation between the hydrophilicity that the UV irradiation typically induces on the TiO2 thin film, and the variation of the optical properties of the film, the mater contact angle on the TiO2 optical coating was also measured after irradiation under similar conditions.
引用
收藏
页码:1164 / +
页数:2
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