Study of pathway of hydrogen migration and desorption on SiGe(100) surface using ab initio calculations

被引:3
作者
Cheng, CL [1 ]
Tsai, DS [1 ]
Jiang, JC [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 106, Taiwan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 10期
关键词
ab initio calculation; cluster model; H-atom migration; H(2) desorption; SiGe;
D O I
10.1143/JJAP.44.7625
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ab initio calculations have been carried out to investigate the pathways of H-atom migration and H(2) desorption on a mixed SiGe(100)-2 x 1 surface using the cluster model. The H(2) recombinative desorption is the rate-detemining step in hydrogen migration and desorption on SiGe(100) surfaces, since the energy barrier to H-atom migration is generally lower than that of H(2) desorption. The energy barriers for H, desorption from the interdimer, the Si-Ge pair, (52.8 kcal/mol), and the Ge-Ge pair, (45.1 kcal/mol), are lower than that for the Si-Si pair by 7.5 and 15.2 kcal/mol, respectively. Thus, the SiGe(100)-2 x 1 surface in chemical vapor deposition provides more dangling bonds than the Si(100)-2 x 1 surface because of Ge inclusion. In contrast, the chemisorbed H tends to stay on the Si-site, since the barrier for H-migration from the Ge-site to the Si-site is lower that in the opposite direction by 5.6 kcal/mol. Hence, a considerably higher percentage of Ge sites are dangling bonds, compared with Si sites on the SiGe(100) surface. Related transition state structures in the migration and desorption steps are also discussed.
引用
收藏
页码:7625 / 7633
页数:9
相关论文
共 37 条
[1]   A NEW MIXING OF HARTREE-FOCK AND LOCAL DENSITY-FUNCTIONAL THEORIES [J].
BECKE, AD .
JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (02) :1372-1377
[2]   DENSITY-FUNCTIONAL EXCHANGE-ENERGY APPROXIMATION WITH CORRECT ASYMPTOTIC-BEHAVIOR [J].
BECKE, AD .
PHYSICAL REVIEW A, 1988, 38 (06) :3098-3100
[3]   An experimental-theoretical study of the behaviour of hydrogen on the Si(001) surface [J].
Bowler, DR ;
Owen, JHG ;
Goringe, CM ;
Miki, K ;
Briggs, GAD .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2000, 12 (35) :7655-7670
[4]  
FRISCH MJ, 1998, GAUSSIAN 98 REVISION, P31302
[5]   Ge thin film growth on Si(111) surface using hydrogen surfactant [J].
Fujino, T ;
Fuse, T ;
Ryu, JT ;
Inudzuka, K ;
Nakano, T ;
Goto, K ;
Yamazaki, Y ;
Katayama, M ;
Oura, K .
THIN SOLID FILMS, 2000, 369 (1-2) :25-28
[6]   The growth of Si/SiGe/Si structures for heterojunction bipolar transistor by gas source molecular beam epitaxy [J].
Gao, F ;
Huang, DD ;
Li, JP ;
Lin, YX ;
Kong, MY ;
Li, JM ;
Zeng, YP ;
Lin, LY .
JOURNAL OF CRYSTAL GROWTH, 2000, 220 (04) :457-460
[7]  
GRABY TJ, 2002, THIN SOLID FILMS, V412, P44
[8]   CONSTRUCTION AND OPERATION OF AN ULTRAHIGH-VACUUM CHEMICAL VAPOR-DEPOSITION EPITAXIAL REACTOR FOR GROWTH OF GEXSI1-X [J].
GREVE, DW ;
RACANELLI, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (03) :511-515
[9]   GROWTH OF EPITAXIAL GERMANIUM-SILICON HETEROSTRUCTURES BY CHEMICAL VAPOR-DEPOSITION [J].
GREVE, DW .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 18 (01) :22-51
[10]   Growth kinetics study of SiGe alloys deposited by rapid thermal process, very low pressure chemical vapor deposition [J].
Gu, SL ;
Zheng, YD ;
Zhang, R ;
Wang, RH .
PHYSICA B, 1996, 229 (01) :74-78