Probing the interface potential in stick/slip friction by a lateral force modulation technique

被引:11
作者
Kerssemakers, J [1 ]
De Hosson, JTM [1 ]
机构
[1] Univ Groningen, Ctr Mat Sci, Dept Appl Phys, NL-9747 AG Groningen, Netherlands
关键词
adhesion; atomic force microscopy; friction; sticking; surface electronic phenomena; tribolog;
D O I
10.1016/S0039-6028(98)00672-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The influence of the shape of the interaction potential is investigated on details in stick/slip friction as encountered between an AFM tip and a substrate. Based on qualitative arguments of stick/slip systems, a novel technique is introduced in which the AFM tip is brought into a lateral resonance mode. In comparison to a direct measurement in the stick/slip signal, we suggest that the method is preferable to highlight these non-linear characteristics. In combination with the shape of the surface potential involved in stick/slip friction, this modulation diminishes the friction loop amplitude in a controlled way. Furthermore, a partial stick/slip behavior is observed above a certain threshold level of driving amplitude, where the tip alternates periodically between a zero-friction and a non-zero-friction state. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:281 / 291
页数:11
相关论文
共 24 条
  • [1] CROSSOVER FROM CREEP TO INERTIAL MOTION IN FRICTION DYNAMICS
    BAUMBERGER, T
    HESLOT, F
    PERRIN, B
    [J]. NATURE, 1994, 367 (6463) : 544 - 546
  • [2] Atomic-scale study of dry sliding friction
    Buldum, A
    Ciraci, S
    [J]. PHYSICAL REVIEW B, 1997, 55 (04): : 2606 - 2611
  • [3] Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope
    Carpick, RW
    Agrait, N
    Ogletree, DF
    Salmeron, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1289 - 1295
  • [4] CARPICK RW, 1997, APPL PHYS LETT, V70, P526
  • [5] MODULATION OF THE CRYSTAL-STRUCTURE IN QUASI-ONE-DIMENSIONAL SOLIDS INDUCED BY IMPURITIES - AN ATOMIC-FORCE MICROSCOPE STUDY
    GONG, Y
    XUE, Q
    DAI, Z
    SLOUGH, CG
    COLEMAN, RV
    FALICOV, LM
    [J]. PHYSICAL REVIEW LETTERS, 1993, 71 (20) : 3303 - 3306
  • [6] Modelling of the scan process in lateral force microscopy
    Holscher, H
    Schwarz, UD
    Wiesendanger, R
    [J]. SURFACE SCIENCE, 1997, 375 (2-3) : 395 - 402
  • [7] ATOMIC-SCALE FRICTION AND WEAR OF MICA
    HU, J
    XIAO, XD
    OGLETREE, DF
    SALMERON, M
    [J]. SURFACE SCIENCE, 1995, 327 (03) : 358 - 370
  • [8] Influence of spring stiffness and anisotropy on stick-slip atomic force microscopy imaging
    Kerssemakers, J
    DeHosson, JTM
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 80 (02) : 623 - 632
  • [9] KERSSEMAKERS J, 1997, J APPL PHYS, V81, P3763
  • [10] KERSSEMAKERS JJ, UNPUB APPL PHYS LETT