An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults

被引:26
|
作者
Saleh, Mashad Uddin [1 ]
Deline, Chris [2 ]
Benoit, Evan [1 ]
Kingston, Samuel [1 ]
Edun, Ayobami S. [3 ]
Jayakumar, Naveen Kumar Tumkur [1 ]
Harley, Joel B. [3 ]
Furse, Cynthia [4 ,5 ]
Scarpulla, Michael [1 ,6 ]
机构
[1] Univ Utah, Dept ECE, Salt Lake City, UT 84112 USA
[2] Natl Renewable Energy Lab, Golden, CO 80401 USA
[3] Univ Florida, Dept ECE, Gainesville, FL 32611 USA
[4] Univ Utah, Elect & Comp Engn Dept, Salt Lake City, UT 84112 USA
[5] LiveWire Innovat, South Jordan, UT 84095 USA
[6] Univ Utah, Dept Mat Sci & Engn, Salt Lake City, UT 84112 USA
来源
IEEE JOURNAL OF PHOTOVOLTAICS | 2020年 / 10卷 / 03期
关键词
Circuit faults; Impedance; Photovoltaic systems; Time-domain analysis; Degradation; Wires; Accelerated degradation faults (ADF); arc faults (AF); bypass diode faults (BDF); connection faults (CF); degradation; ground faults (GF); open-circuit (OC) faults; photovoltaic (PV) cells; reflectometry; shading faults; short-circuit (SC) faults; spread spectrum time domain reflectometry (SSTDR); SERIES ARC FAULT; PV MODULES; LOCATION; DIAGNOSIS; SENSORS;
D O I
10.1109/JPHOTOV.2020.2972356
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.
引用
收藏
页码:844 / 851
页数:8
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