High-performance top and bottom double-gate low-temperature poly-silicon thin film transistors fabricated by excimer laser crystallization

被引:43
作者
Tsai, Chun-Chien [1 ,2 ]
Lee, Yao-Jen [3 ]
Wang, Jyh-Liang [1 ,2 ]
Wei, Kai-Fang [1 ,2 ]
Lee, I-Che [1 ,2 ]
Chen, Chih-Chung [4 ]
Cheng, Huang-Chung [1 ,2 ]
机构
[1] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan
[2] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30039, Taiwan
[3] Natl Nano Device Labs, Hsinchu, Taiwan
[4] Chunghwa Picture Tubes Ltd, Tao Yuan, Taiwan
关键词
excimer laser crystallization; double-gate; thin film transistor (TFT);
D O I
10.1016/j.sse.2007.10.029
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, high-performance low-temperature poly-silicon (LTPS) thin film transistors (TFTs) with double-gate (DG) structure and lateral grain growth have been demonstrated by excimer laser crystallization (ELC). Therefore, the DG TFTs with lateral silicon grains in the channel regions exhibited better current-voltage characteristics as compared with the conventional solid-phase crystallized (SPC) poly-Si double-gate TFTs or conventional ELC top-gate (TG) TFTs. The proposed ELC DG TFTs (W/L = 1.5/1.5 mu m) had the field-effect-mobility exceeding 400 cm(2)/V s, on/off current ratio higher than 10(8), superior short-channel characteristics and higher current drivability. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:365 / 371
页数:7
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