Detection threshold control of CR-39 plastic nuclear track detectors for the selective measurement of high LET secondary charged particles

被引:8
作者
Kodaira, S. [1 ]
Yasuda, N. [1 ]
Kawashima, H. [1 ]
Kurano, M. [1 ]
Naka, S. [2 ]
Ota, S. [2 ]
Ideguchi, Y. [2 ]
Hasebe, N. [2 ]
Ogura, K. [3 ]
机构
[1] Natl Inst Radiol Sci, Radiat Measurement Res Sect, Inage Ku, Chiba 2638555, Japan
[2] Waseda Univ, Res Inst Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan
[3] Nihon Univ, Coll Ind Technol, Narashino, Chiba 2758576, Japan
关键词
CR-39; Track etching; PEW; High LET particle; Space radiation; Secondary particle; Short range track; THERAPY;
D O I
10.1016/j.radmeas.2011.08.015
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
The two-step etching method using PEW (Potassium hydroxide + Ethanol + Water) and NaOH solutions was applied to the control of the response of CR-39 plastic nuclear track detectors for the measurement of high LET (linear energy transfer) particles. CR-39 detectors were exposed to several heavy ion beams covering the LET infinity H2O range of 30-750 key/mu m from HIMAC (Heavy Ion Medical Accelerator in Chiba) at NIRS (National Institute of Radiological Sciences), Japan. The detectors were pre-etched in PEW solutions with 3 different ethanol concentrations at the temperature of 70 degrees C for 30-60 min. Then, the detectors were post-etched in 7N NaOH solution at the same temperature for 4-28 h. We found that the response curves and the detection thresholds of the detectors smoothly shifted to higher LET regions as the ethanol concentration increases in PEW solution. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1782 / 1785
页数:4
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