Evolution of Ag3Sn at Sn-3.0Ag-0.3Cu-0.05Cr/Cu joint interfaces during thermal aging
被引:38
作者:
Lin, Fei
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Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Lin, Fei
[1
]
Bi, Wenzhen
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Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Bi, Wenzhen
[1
]
Ju, Guokui
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Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Ju, Guokui
[1
]
Wang, Wurong
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Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Wang, Wurong
[1
]
Wei, Xicheng
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Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Chinese Minist Educ, Key State Lab New Displays & Syst Integrat, Shanghai 200072, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
Wei, Xicheng
[1
,2
]
机构:
[1] Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
[2] Chinese Minist Educ, Key State Lab New Displays & Syst Integrat, Shanghai 200072, Peoples R China
The intermetallic compounds (IMC) in the solder and at the interface of Sn-3.0Ag-0.5Cu (SAC)/Cu and Sn-3.0Ag-0.3Cu-0.05Cr (SACC)/Cu joints were investigated after isothermal aging at 150 degrees C for 0, 168 and 500 h. Different shaped Ag3Sn phases were found near the IMC layer of the latter joint. Interestingly, fine rod-shaped and branch-like Ag3Sn were detected near the interface after soldering and long Ag3Sn changed into shorter rods and small particles during aging. It is investigated that the Cr addition and thermal aging have effect on the evolution of Ag3Sn morphologies and it is controlled by interfacial diffusion. Energy minimization theory and the redistribution of elements are used to explain the morphological evolution of Ag3Sn. Small Ag3Sn particles were also found on the IMC layer after aging, unlike the large Ag3Sn at that of SAC/Cu joints. In conclusion, a favorable morphology of the joint interface leads to better bonding properties for SACC/Cu joints against thermal aging than that for SAC/Cu. (C) 2011 Elsevier B. V. All rights reserved.
机构:
Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Guo-kui, Ju
Xi-cheng, Wei
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机构:
Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Shanghai Univ, Key State Lab New Displays & Syst Integrat, Chinese Minist Educ, Sinoswedish Microsyst Integrat Technol SMIT Ctr, Shanghai, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Xi-cheng, Wei
Peng, Sun
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机构:
Shanghai Univ, Key State Lab New Displays & Syst Integrat, Chinese Minist Educ, Sinoswedish Microsyst Integrat Technol SMIT Ctr, Shanghai, Peoples R China
Chalmers, SMIT Ctr, S-41296 Gothenburg, SwedenShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
[5]
Guobiao Su, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), P393, DOI 10.1109/IPFA.2009.5232623
机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Liu, Xiaoying
Huang, Mingliang
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机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Huang, Mingliang
Zhao, Yanhui
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Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Zhao, Yanhui
Wu, C. M. L.
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机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Wu, C. M. L.
Wang, Lai
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机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
机构:
Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Guo-kui, Ju
Xi-cheng, Wei
论文数: 0引用数: 0
h-index: 0
机构:
Shanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Shanghai Univ, Key State Lab New Displays & Syst Integrat, Chinese Minist Educ, Sinoswedish Microsyst Integrat Technol SMIT Ctr, Shanghai, Peoples R ChinaShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
Xi-cheng, Wei
Peng, Sun
论文数: 0引用数: 0
h-index: 0
机构:
Shanghai Univ, Key State Lab New Displays & Syst Integrat, Chinese Minist Educ, Sinoswedish Microsyst Integrat Technol SMIT Ctr, Shanghai, Peoples R China
Chalmers, SMIT Ctr, S-41296 Gothenburg, SwedenShanghai Univ, Sch Mat Sci & Engn, Shanghai, Peoples R China
[5]
Guobiao Su, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), P393, DOI 10.1109/IPFA.2009.5232623
机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Liu, Xiaoying
Huang, Mingliang
论文数: 0引用数: 0
h-index: 0
机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Huang, Mingliang
Zhao, Yanhui
论文数: 0引用数: 0
h-index: 0
机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Zhao, Yanhui
Wu, C. M. L.
论文数: 0引用数: 0
h-index: 0
机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
Wu, C. M. L.
Wang, Lai
论文数: 0引用数: 0
h-index: 0
机构:
Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R ChinaDalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China