Transient response testing of analogue components in mixed-signal systems: a review

被引：2

作者：

Taylor, D ^{[1
]}

机构：

[1] Univ Huddersfield, Sch Engn, Dept Elect & Elect Engn, Huddersfield HD1 3DH, W Yorkshire, England

来源：

IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 1998年 / 145卷 / 05期

关键词：

analogue; IDD; fault models; mixed signal; test; testability; TRT;

D O I：

10.1049/ip-cds:19982007

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Transient response testing has developed over the last few years from a benchtop characterisation technique into a very powerful production test technique for all types of analogue components in mixed-signal electronic systems. The author reviews recent progress in this area, summarising results from both simulations and work on real circuits, then briefly describes the directions in which current research work is progressing.

引用

页码：314 / 318

页数：5

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