Highly-stable (< 3% fluctuation) Ag-based Threshold Switch with Extreme-low OFF Current of 0.1 pA, Extreme-high Selectivity of 109 and High Endurance of 109 Cycles

被引:20
作者
Banerjee, Writam [1 ]
Karpov, Ilya, V [2 ]
Agrawal, Ashish [2 ]
Kim, Seonghun [3 ]
Lee, Seungwoo [1 ]
Lee, Sangmin [1 ]
Lee, Donghwa [3 ]
Hwang, Hyunsang [1 ]
机构
[1] Pohang Univ Sci & Technol POSTECH, Ctr Single Atom Based Semicond Device, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Intel Corp, Components Res, Hillsboro, OR 97124 USA
[3] Pohang Univ Sci & Technol POSTECH, Computat Nanomat Design Lab, Dept Mat Sci & Engn, Pohang 790784, South Korea
来源
2020 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | 2020年
关键词
D O I
10.1109/IEDM13553.2020.9371960
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate driving parameters to control the hybrid-filament (HF) in Ag-based threshold switching (TS) devices. To achieve statistically improved TS behavior, we engineer the nucleation energy barrier, shape of HF and steric repulsion force during TS-operation. Finally, we demonstrate TS with extremely low OFF current (0.1 pA), extremely high selectivity (> 10(9)) with stable threshold voltage (< 3% fluctuation), high endurance (> 10(9)) with stable steep subthreshold slope similar to 1 mV/dec, and high device-yield in Ag based devices.
引用
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页数:4
相关论文
共 12 条
[1]   Quantized Conduction Device with 6-Bit Storage Based on Electrically Controllable Break Junctions [J].
Banerjee, Writam ;
Hwang, Hyunsang .
ADVANCED ELECTRONIC MATERIALS, 2019, 5 (12)
[2]  
Fujii S., 2019, IEEE S VLSI TECHN DI, pT188
[3]   Performance Enhancement of Ag/HfO2 Metal Ion Threshold Switch Cross-Point Selectors [J].
Grisafe, Benjamin ;
Jerry, Matthew ;
Smith, Jeffrey A. ;
Datta, Suman .
IEEE ELECTRON DEVICE LETTERS, 2019, 40 (10) :1602-1605
[4]   Evidence of field induced nucleation in phase change memory [J].
Karpov, I. V. ;
Mitra, M. ;
Kau, D. ;
Spadini, G. ;
Kryukov, Y. A. ;
Karpov, V. G. .
APPLIED PHYSICS LETTERS, 2008, 92 (17)
[5]   CMOS compatible low-power volatile atomic switch for steep-slope FET devices [J].
Lim, Seokjae ;
Yoo, Jongmyung ;
Song, Jeonghwan ;
Woo, Jiyong ;
Park, Jaehyuk ;
Hwang, Hyunsang .
APPLIED PHYSICS LETTERS, 2018, 113 (03)
[6]   Hybrid-RRAM toward Next Generation of Nonvolatile Memory: Coupling of Oxygen Vacancies and Metal Ions [J].
Sassine, Gilbert ;
Nail, Cecile ;
Blaise, Philippe ;
Sklenard, Benoit ;
Bernard, Mathieu ;
Gassilloud, Remy ;
Marty, Aurelie ;
Veillerot, Marc ;
Vallee, Christophe ;
Nowak, Etienne ;
Molas, Gabriel .
ADVANCED ELECTRONIC MATERIALS, 2019, 5 (02)
[7]   Effects of Liner Thickness on the Reliability of AgTe/TiO2-Based Threshold Switching Devices [J].
Song, Jeonghwan ;
Woo, Jiyong ;
Yoo, Jongmyung ;
Chekol, Solomon Amsalu ;
Lim, Seokjae ;
Sung, Changhyuck ;
Hwang, Hyunsang .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (11) :4763-4767
[8]   Threshold Selector With High Selectivity and Steep Slope for Cross-Point Memory Array [J].
Song, Jeonghwan ;
Woo, Jiyong ;
Prakash, Amit ;
Lee, Daeseok ;
Hwang, Hyunsang .
IEEE ELECTRON DEVICE LETTERS, 2015, 36 (07) :681-683
[9]  
Sukla N., 2016, IEEE IEDM, P866
[10]  
Sung C, 2019, S VLSI TECH, pT62, DOI 10.23919/VLSIT.2019.8776527