Surface Directed Phase Separation of Semiconductor Ferroelectric Polymer Blends and their Use in Non-Volatile Memories

被引:39
|
作者
van Breemen, Albert [1 ]
Zaba, Tomasz [1 ]
Khikhlovskyi, Vsevolod [1 ,2 ]
Michels, Jasper [1 ]
Janssen, Rene [2 ]
Kemerink, Martijn [2 ,3 ]
Gelinck, Gerwin [1 ]
机构
[1] TNO, Holst Ctr, Eindhoven, Netherlands
[2] Eindhoven Univ Technol, NL-5600 MB Eindhoven, Netherlands
[3] Linkoping Univ, Dept Phys Chem & Biol IFM, S-58183 Linkoping, Sweden
关键词
polymer blends; phase separation; ferroelectric diode; resistive switch; non-volatile memory; FREE-ENERGY; FILMS;
D O I
10.1002/adfm.201401896
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The polymer phase separation of P(VDF-TrFE):F8BT blends is studied in detail. Its morphology is key to the operation and performance of memory diodes. In this study, it is demonstrated that it is possible to direct the semiconducting domains of a phase-separating mixture of P(VDF-TrFE) and F8BT in a thin film into a highly ordered 2D lattice by means of surface directed phase separation. Numerical simulation of the surface-controlled de-mixing process provides insight in the ability of the substrate pattern to direct the phase separation, and hence the regularity of the domain pattern in the final dry blend layer. By optimizing the ratio of the blend components, the number of electrically active semiconductor domains is maximized. Pattern replication on a cm-scale is achieved, and improved functional device performance is demonstrated in the form of a 10-fold increase of the ON-current and a sixfold increase in current modulation. This approach therefore provides a simple and scalable means to higher density integration, the ultimate target being a single semiconducting domain per memory cell.
引用
收藏
页码:278 / 286
页数:9
相关论文
共 50 条
  • [1] Structure of Phase-Separated Ferroelectric/Semiconducting Polymer Blends for Organic Non-volatile Memories
    McNeill, Christopher R.
    Asadi, Kamal
    Watts, Benjamin
    Blom, Paul W. M.
    de Leeuw, Dago M.
    SMALL, 2010, 6 (04) : 508 - 512
  • [2] Organic non-volatile memories from ferroelectric phase-separated blends
    Kamal Asadi
    Dago M. de Leeuw
    Bert de Boer
    Paul W. M. Blom
    Nature Materials, 2008, 7 : 547 - 550
  • [3] Organic non-volatile memories from ferroelectric phase-separated blends
    Asadi, Kamal
    De Leeuw, Dago M.
    De Boer, Bert
    Blom, Paul W. M.
    NATURE MATERIALS, 2008, 7 (07) : 547 - 550
  • [4] Overview of emerging semiconductor non-volatile memories
    Fujisaki, Yoshihisa
    IEICE ELECTRONICS EXPRESS, 2012, 9 (10): : 908 - 925
  • [5] Switching dynamics in non-volatile polymer memories
    Verbakel, Frank
    Meskers, Stefan C. J.
    Janssen, Rene A. J.
    Gomes, Henrique L.
    van den Biggelaar, Antonius J. M.
    de Leeuw, Dago M.
    ORGANIC ELECTRONICS, 2008, 9 (05) : 829 - 833
  • [6] Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories
    Ramesh, R
    Aggarwal, S
    Auciello, O
    MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2001, 32 (06): : 191 - 236
  • [7] High-performance non-volatile field-effect transistor memories using an amorphous oxide semiconductor and ferroelectric polymer
    Wang, Yu
    Kizu, Takio
    Song, Lei
    Zhang, Yujia
    Jiang, Sai
    Qian, Jun
    Wang, Qijing
    Shi, Yi
    Zheng, Youdou
    Nabatame, Toshihide
    Tsukagoshi, Kazuhito
    Li, Yun
    JOURNAL OF MATERIALS CHEMISTRY C, 2016, 4 (34) : 7917 - 7923
  • [8] Imprint induced failure modes in ferroelectric non-volatile memories
    Benedetto, JM
    INTEGRATED FERROELECTRICS, 1997, 15 (1-4) : 29 - 38
  • [9] Fatigue behaviour of ferroelectric thin films for non-volatile memories
    Chiorboli, G
    Franco, G
    Leccabue, F
    Watts, BE
    INTEGRATED FERROELECTRICS, 1995, 8 (1-2) : 99 - 108
  • [10] Ferroelectric switching of poly(vinylidene difluoride-trifluoroethylene) in metal-ferroelectric-semiconductor non-volatile memories with an amorphous oxide semiconductor
    Gelinck, G. H.
    van Breemen, A. J. J. M.
    Cobb, B.
    APPLIED PHYSICS LETTERS, 2015, 106 (09)