Research for intelligence method and equipment of switch test base on single chip microprocessor

被引：0

作者：

Yao, XH ^{[1
]}

Situ, Z ^{[1
]}

Zheng, YN ^{[1
]}

机构：

[1] Guangdong Tech Univ, Mech & Elect Dept, Guangdong, Peoples R China

来源：

PROCEEDINGS OF THE 3RD WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-5 | 2000年

关键词：

single chip microprocessor; intelligence check and measure; roational switch;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Contrast to traditional check and test method of onoff static in the manufacture of roational switch. Author brings forward to using a single chip microprocessor as the control core of it, and design a new test equipment which has been put into process line by now.

引用

页码：1446 / 1449

页数：4