Frequency measurement of an Ar+ laser stabilized on narrow lines of molecular iodine at 501.7 nm

被引：24

作者：

du Burck, F ^{[1
]}

Daussy, C

Amy-Klein, A

Goncharov, AN

Lopez, O

Chardonnet, C

Wallerand, JP

机构：

[1] Univ Paris 13, CNRS, UMR 7538, Phys Lasers Lab, F-93430 Villetaneuse, France

[2] Russian Acad Sci, Siberian Branch, Inst Laser Phys, Novosibirsk, Russia

[3] Conservatoire Natl Arts & Metiers, INM, BNM, F-75003 Paris, France

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2005年 / 54卷 / 02期

关键词：

iodine spectroscopy; frequency modulation (FM) spectroscopy; optical frequency measurement; residual amplitude modulation;

D O I：

10.1109/TIM.2005.843579

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A spectrometer for ultrahigh-resolution spectroscopy of molecular iodine at wavelength of 501.7 nm, near the dissociation limit is described. Line shapes about 30 kHz wide half-width half-maximum (HWHM) were obtained using saturation spectroscopy in a pumped cell. The frequency of an Ar+ laser was locked to a hyperfine component of the R(26)62-0 transition and the first absolute frequency measurement of this line is reported.

引用

页码：754 / 758

页数：5

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