PHASE IDENTIFICATION AND MICROSTRUCTURE ANALYSIS OF INTERFACE Al-Si/SiC COMPOSITES

Phase composition determined by X-ray diffraction (XRD) and microstructure analysis using scanning electron microscopy (SEM) have been performed on Al-Si/15% SiC composites prepared by stir casting method to investigate interface properties. Energy-dispersive X-ray spectroscopy (EDS) was also used to examine the product at interface where crystallisation was prominent. The interface reaction between particles and matrix was indicated that the nucleation of MgAl2O4, Mg2Si and MgO phases growth in the composites. These Interface reaction products play an important role to ensure good physical and mechanical properties of composites.