Ultrafast pump-probe ellipsometry setup for the measurement of transient optical properties during laser ablation

被引:54
作者
Rapp, Stephan [1 ,2 ]
Kaiser, Michael [1 ]
Schmidt, Michael [3 ]
Huber, Heinz P. [1 ]
机构
[1] Munich Univ Appl Sci, Dept Appl Sci & Mechatron, Lothstr 34, D-80335 Munich, Germany
[2] Univ Erlangen Nurnberg, Erlangen Grad Sch Adv Opt Technol SAOT, Paul Gordan Str 6, D-91052 Erlangen, Germany
[3] Univ Erlangen Nurnberg, Lehrstuhl Photon Technol, Konrad Zuse Str 3-5, D-91052 Erlangen, Germany
关键词
HIGH-REPETITION-RATE; THIN-FILMS; PULSES; METALS; DYNAMICS; ELECTRON; NANOSECOND; MECHANISMS; EXCITATION; SILICON;
D O I
10.1364/OE.24.017572
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ultrashort pulsed lasers offer a high potential in precise and efficient material processing and deep understanding of the fundamental laser-material interaction aspects is of great importance. The transient pulse reflectivity in conjunction with the transient absorption influences decisively the laser-material interaction. Direct measurements of the absorption properties by ultrafast time-resolved ellipsometry are missing to date. In this work, a unique pump-probe ellipsometry microscope is presented allowing the determination of the transient complex refractive index with a sub-ps temporal resolution. Measurements on molybdenum show ultrafast optical penetration depth changes of -6% to + 77% already within the first 10 ps after the laser pulse impact. This indicates a significant absorption variation of the pump pulse or subsequent pulses irradiating the sample on this timescale and paves the road towards a better understanding of pulse duration dependent laser ablation efficiency, double or burst mode laser ablation and lattice modifications in the first ps after the laser pulse impact. (C) 2016 Optical Society of America
引用
收藏
页码:17572 / 17592
页数:21
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