Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis

被引：11

作者：

Sternlicht, Hadas ^{[1
,6
]}

Rheinheimer, Wolfgang ^{[2
,5
]}

Kim, Judy ^{[3
,4
]}

Liberti, Emanuela ^{[3
,4
]}

Kirkland, Angus I. ^{[3
,4
]}

Hoffmann, Michael J. ^{[5
]}

Kaplan, Wayne D. ^{[6
]}

机构：

[1] Brown Univ, Sch Engn, Providence, RI 02912 USA

[2] Purdue Univ, Mat Engn, W Lafayette, IN 47907 USA

[3] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England

[4] Diamond Lightsource Ltd, Elect Phys Sci Imaging Ctr, Diamond House, Didcot OX11 0DE, Oxon, England

[5] Karlsruhe Inst Technol, Inst Appl Mat, Karlsruhe, Germany

[6] Technion Israel Inst Technol, Dept Mat Sci & Engn, Haifa, Israel

来源：

JOURNAL OF MATERIALS SCIENCE | 2019年 / 54卷 / 05期

基金：

英国工程与自然科学研究理事会;

关键词：

TRANSMISSION ELECTRON-MICROSCOPY; WAVE-ABERRATION FUNCTION; HIGH-RESOLUTION TEM; FOURIER IMAGES; STRONTIUM-TITANATE; RECONSTRUCTION; MICROGRAPHS; HRTEM; SHAPE;

D O I：

10.1007/s10853-018-3095-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Disconnections were recently shown to play a role in the mechanism of grain boundary motion in general grain boundaries in SrTiO3. In this work, we demonstrate the existence of disconnections in the viewing direction along the projected thickness of transmission electron microscopy samples and characterize possible aspects of the structure of these disconnections. We show that the presence of steps along the viewing direction may result in the appearance of a disordered region at the boundary, while it is actually composed of ordered crystalline material. We discuss the subsequent complications in analysis of transmission electron microscopy data and strict meaning of the term edge-on for grain boundaries.

引用

页码：3710 / 3725

页数：16

共 31 条

[1] Exit wave reconstruction at atomic resolution
Allen, LJ
McBride, W
O'Leary, NL
Oxley, MP
[J]. ULTRAMICROSCOPY, 2004, 100 (1-2) : 91 - 104
[2] Influence of Sr/Ti Stoichiometry on the Densification Behavior of Strontium Titanate
Baeurer, Michael
Kungl, Hans
Hoffmann, Michael J.
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (03) : 601 - 606
[3] Quantitative HRTEM analysis of FIB prepared specimens
Baram, M.
Kaplan, W. D.
[J]. JOURNAL OF MICROSCOPY, 2008, 232 (03) : 395 - 405
[4] Comparisons of linear and nonlinear image restoration
Chang, Lan-Yun
Kirkland, Angus I.
[J]. MICROSCOPY AND MICROANALYSIS, 2006, 12 (06) : 469 - 475
[5] Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
Coene, WMJ
Thust, A
deBeeck, M
VanDyck, D
[J]. ULTRAMICROSCOPY, 1996, 64 (1-4) : 109 - 135
[6] FOURIER IMAGES .2. THE OUT-OF-FOCUS PATTERNS
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 497 - &
[7] FOURIER IMAGES .1. THE POINT SOURCE
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 486 - +
[8] FOURIER IMAGES .4. THE PHASE GRATING
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1960, 76 (489): : 378 - &
[9] FOURIER IMAGES .3. FINITE SOURCES
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 505 - &
[10] Haigh S, 2012, MODELING NANOSCALE I, P41

← 1 2 3 4 →