Latch divergency in microprocessor failure analysis

被引：0

作者：

Dahlgren, P ^{[1
]}

Dickinson, P ^{[1
]}

Parulkar, I ^{[1
]}

机构：

[1] Sun Microsyst Inc, Proc & Network Prod, Sunnyvale, CA 94085 USA

来源：

INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS | 2003年

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Divergence Analysis (LDA) is proposed for creating stable failure signatures and reducing system noise. The methodology and processing flow have been integrated into the normal debug flow for the UltraSPARC(TM) family processors and have been successfully applied in numerous debugs in the bring-up of new products.

引用

页码：755 / 763

页数：9

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