Electric-field induced interfacial cracking in multilayer electrostrictive actuators

被引:70
作者
Ru, CQ [1 ]
Mao, X
Epstein, M
机构
[1] Univ Alberta, Dept Mech Engn, Edmonton, AB T6G 2G8, Canada
[2] Univ Calgary, Dept Engn Mech, Calgary, AB T2N 1N4, Canada
关键词
delamination; electromechanical processes; ceramic material;
D O I
10.1016/S0022-5096(98)00038-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electric-field induced interfacial cracking in multilayer electrostrictive actuators is studied for two typical cases: (1) an interface crack lying between an electrode layer and ceramic matrix; and (2) an interface crack with one tip at an embedded electrode-edge. Based on the small-scale saturation solutions, a direct method is proposed to calculate the electric-field induced stress intensity factors that avoids calculating the stress field. The effectiveness of the direct method is demonstrated by comparing the results derived with the known numerical solutions. For either case, the explicit condition is given that prohibits interfacial crack growth by restricting the thickness of ceramic layers and the intensity of the applied electric field. Especially, the maximum stress intensity factor derived for the above case (2) is found to be significantly larger than that obtained in the existing works for the electrode-tip matrix cracks. This result agrees with the experimental fact that interfacial cracking is the dominant failure mechanism in electrostrictive multilayer devices. Hence, the reliability design should be based on the conditions that prohibit interfacial cracking. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1301 / 1318
页数:18
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