Reflectance measurement of two-dimensional photonic crystal nanocavities with embedded quantum dots

被引:7
作者
Stumpf, W. C. [1 ]
Asano, T. [1 ]
Kojima, T. [1 ]
Fujita, M. [1 ]
Tanaka, Y. [1 ]
Noda, S. [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Nishikyo Ku, Kyoto 6158510, Japan
来源
PHYSICAL REVIEW B | 2010年 / 82卷 / 07期
基金
日本科学技术振兴机构;
关键词
EMISSION; ELECTRODYNAMICS;
D O I
10.1103/PhysRevB.82.075119
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The spectra of two-dimensional photonic crystal slab nanocavities with embedded InAs quantum dots are measured by photoluminescence and reflectance. In comparing the spectra taken by these two different methods, consistency with the nanocavities' resonant wavelengths is found. Furthermore, it is shown that the reflectance method can measure both active and passive cavities. Q factors of nanocavities, whose resonant wavelengths range from 1280 to 1620 nm, are measured by the reflectance method in cross polarization. Experimentally, Q factors decrease for longer wavelengths and the intensity, reflected by the nanocavities on resonance, becomes minimal around 1370 nm. The trend of the Q factors is explained by the change in the slab thickness relative to the resonant wavelength, showing a good agreement between theory and experiment. The trend of reflected intensity by the nanocavities on resonance can be understood as effects that originate from the photonic crystal slab and the underlying air-cladding thicknesses. In addition to three-dimensional finite-difference time-domain calculations, an analytical model is introduced that is able to reproduce the wavelength dependence of the reflected intensity observed in the experiment.
引用
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页数:7
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