Time-diagnostics for improved dynamics experiments at XUV FELs

被引：18

作者：

Drescher, Markus ^{[1
]}

Fruehling, Ulrike ^{[1
]}

Krikunova, Maria ^{[1
]}

Maltezopoulos, Theophilos ^{[1
]}

Wieland, Marek ^{[1
]}

机构：

[1] Univ Hamburg, Inst Expt Phys, D-22761 Hamburg, Germany

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2010年 / 43卷 / 19期

关键词：

FREE-ELECTRON LASER; EXTREME-ULTRAVIOLET; PULSES; RADIATION;

D O I：

10.1088/0953-4075/43/19/194010

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Significantly structured and fluctuating temporal profiles of pulses from self-amplified spontaneous emission free electron lasers as well as their unstable timing require time diagnostics on a single-shot basis. The duration and structure of extreme-ultraviolet (XUV) pulses from the Free Electron Laser (FEL) in Hamburg (FLASH) are becoming accessible using a variation of the streak camera principle, where photoemitted electrons are energetically streaked in the electric field component of a terahertz electromagnetic wave. The timing with respect to an independently generated laser pulse can be measured in an XUV/laser cross-correlator, based on a non-collinear superposition of both pulses on a solid state surface and detection of XUV-induced modulations of its reflectivity for visible light. Sorting of data according to the measured timing dramatically improves the temporal resolution of an experiment sampling the relaxation of transient electronic states in xenon after linear-as well as nonlinear excitation with intense XUV pulses from FLASH.

引用

页数：11

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