Electronic structure based design of thin film metallic glasses with superior fracture toughness

被引:15
作者
Evertz, Simon [1 ]
Kirchlechner, Ines [2 ]
Soler, Rafael [2 ]
Kirchlechner, Christoph [2 ]
Kontis, Paraskevas [2 ]
Bednarcik, Jozef [3 ]
Gault, Baptiste [2 ,4 ]
Dehm, Gerhard [2 ]
Raabe, Dierk [2 ]
Schneider, Jochen M. [1 ]
机构
[1] Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany
[2] Max Planck Inst Eisenforsch GmbH, Max Planck Str 1, D-40237 Dusseldorf, Germany
[3] Safarik Univ, Inst Phys, Dept Condensed Matter Phys, Pk Angelinum 9, Kosice 04154, Slovakia
[4] Imperial Coll, Dept Mat, London SW7 2AZ, England
关键词
Metallic glass; Ab initio; Fracture toughness; Chemical bonding; PLANE-WAVE; SINGLE-CRYSTAL; SAMPLE-SIZE; ENERGY; MICRO; PLASTICITY; CHEMISTRY; DETECTOR; COHP;
D O I
10.1016/j.matdes.2019.108327
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High fracture toughness is crucial for the application of metallic glasses as structural materials to avoid catastrophic failure of the material in a brittle manner. One fingerprint for fracture toughness in metallic glasses is the fraction of hybridized bonds, which is affected by alloying Pd57.4Al23.5Y7.8M11.3 with M = Fe, Ni, Co, Cu, Os, Ir, Pt, and Au. It is shown that experimental fracture toughness data is correlated to the fraction of hybridized bonds which scale with the localized bonds at the Fermi level. Thus, the localized bonds at the Fermi level are utilized quantitatively as a measure for fracture toughness. Based on ab initio calculations, the minimum fraction of hybridized bonds was identified for Pd57.4Al23.5Y7.8Ni11.3. According to the ansatz that the crystal orbital overlap population at the Fermi level scales with fracture toughness, for Pd57.4Al23.5Y7.8Ni11.3 a value of around 95 +/- 20 MPa.m(0.5) is predicted quantitatively for the first time. Consistent with this prediction, in micro-mechanical beam bending experiments Pd57.4Al23.5Y7.8Ni11.3 thin films show pronounced plasticity and absence of crack growth. (c) 2018 The Authors. Published by Elsevier Ltd.
引用
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页数:9
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