Temperature measurements near the contact line of an evaporating meniscus V-groove

被引:33
作者
Migliaccio, Christopher P.
Dhavaleswarapu, Hemanth K.
Garimella, Suresh V. [1 ]
机构
[1] Purdue Univ, Cooling Technol Res Ctr, Sch Mech Engn, W Lafayette, IN 47907 USA
基金
美国国家科学基金会;
关键词
Evaporation; Thin liquid film; V-groove; Temperature dip; HEAT-TRANSFER; PHASE-CHANGE; FLOW; FILM;
D O I
10.1016/j.ijheatmasstransfer.2010.11.040
中图分类号
O414.1 [热力学];
学科分类号
摘要
Evaporation from a meniscus of heptane liquid in a V-groove geometry is experimentally investigated. A thin layer of titanium coated on the backside of the fused quartz groove is electrically heated to provide a constant heat flux. The temperature profile in the evaporating thin film region of the extended meniscus is measured using high-resolution infrared thermography and the temperature suppression in this region is obtained as a function of liquid feeding rate. The meniscus shape is captured using a goniometer. A temperature suppression of similar to 0.2 Kin the 150 mu m region surrounding the contact line on each side indicates the efficacy of evaporation in the extended meniscus. At a given axial location, the fraction of total meniscus heat transfer which takes place in a 50 mu m sub-region measured from the contact line is estimated by an approximate heat balance analysis to be similar to 45% for the range of liquid feeding rates explored. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1520 / 1526
页数:7
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