Study on the fabrication of n-type CuAlSe2 thin films

被引:14
作者
Barkat, L
Morsli, M
Amory, C
Marsillac, S
Khelil, A
Bernède, JC
El Moctar, C
机构
[1] Univ Nantes, LPSE, FSTN, Nantes 3, France
[2] LPMCE, Oran Es Senia, Algeria
关键词
chalcopyrite; thin film; large band gap; n-type doping;
D O I
10.1016/S0040-6090(03)00209-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chalcopyrite semiconductors with large band gap are generally p-type and the realization of n-type materials has been found difficult. CuAlSe2, with a band gap of 2.68 eV, is one of these compounds. Up to now, the n-type has only been obtained on Zn-doped single crystals. In the present work we describe a different way used to try to achieve n-type CuAlSe2. Thin films of CuAlSe2 have been doped by Au/K, Zn, Cd. The films have been characterized by electrical measurements but also by X-ray diffraction, electron probe microanalysis, optical measurements, photoluminescence and X-ray photoelectron spectroscopy. It is shown by the hot probe technique that annealing for half an hour at 823 K doped films can be allowed achieve polycrystalline n-type CuAlSe2. However, if we succeeded in incorporating the doping element Cd, Zn and K, the n-type conductivity was not systematically achieved. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:99 / 104
页数:6
相关论文
共 17 条
[1]  
AKSENOV IA, 1998, PHYS STATUS SOLIDI A, V108, pK63
[2]   LP-MOCVD GROWTH OF CUALSE2 EPITAXIAL LAYERS [J].
CHICHIBU, S ;
IWAI, A ;
MATSUMOTO, S ;
HIGUCHI, H .
JOURNAL OF CRYSTAL GROWTH, 1993, 126 (04) :635-642
[3]   PHOTOLUMINESCENCE STUDIES IN CUALSE2 EPILAYERS GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION [J].
CHICHIBU, S ;
SHIRAKATA, S ;
ISOMURA, S ;
HARADA, Y ;
UCHIDA, M ;
MATSUMOTO, S ;
HIGUCHI, H .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (03) :1225-1232
[4]   Postgrowth thermal treatment of CuIn(Ga)Se2:: Characterization of doping levels in In-rich thin films [J].
Dirnstorfer, I ;
Hofmann, DM ;
Meister, D ;
Meyer, BK .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (03) :1423-1428
[5]  
El Moctar CO, 1999, PHYS STATUS SOLIDI A, V174, P213, DOI 10.1002/(SICI)1521-396X(199907)174:1<213::AID-PSSA213>3.0.CO
[6]  
2-8
[7]   PREPARATION AND PROPERTIES OF SINGLE CRYSTAL CUALS2 AND CUALSE2 [J].
HONEYMAN, WN .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1969, 30 (08) :1935-&
[8]   DEPTH PROFILING ANALYSIS OF ALUMINUM OXIDATION DURING FILM DEPOSITION IN A CONVENTIONAL HIGH-VACUUM SYSTEM [J].
KIM, J ;
WEIMER, JJ ;
ZUKIC, M ;
TORR, DG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (06) :3062-3067
[9]   Fermi-level-dependent defect formation in Cu-chalcopyrite semiconductors [J].
Klein, A ;
Jaegermann, W .
APPLIED PHYSICS LETTERS, 1999, 74 (16) :2283-2285
[10]  
Kronik L, 1998, ADV MATER, V10, P31, DOI 10.1002/(SICI)1521-4095(199801)10:1<31::AID-ADMA31>3.0.CO