De-embedding of port discontinuities in full-wave CAD models of multi-port circuits

被引:0
作者
Okhmatovski, VI [1 ]
Morsey, J [1 ]
Cangellaris, AC [1 ]
机构
[1] Univ Illinois, Dept ECE, Urbana, IL 61801 USA
来源
2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 2003年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Systematic numerical methodology is proposed for accurate de-embedding of the port discontinuities in full-wave models of the unbounded multi-port circuits. The approach is based on the idea of short-open calibration (SOC). The latter being a numerical analog of the experimental TRL-technique provides a consistent removal of the feed networks in a wide range of frequencies. The treatment of multi-port topologies is achieved through the continuation of the original scalar SOC into the vector space. The new vector short-open calibration (VSOC) method provides a seamless interface with the integral equation based method of moments (MoM) solvers. Owing to the distributed nature of the microwave circuits the method allows for a substantial flexibility in the choice of the excitation mechanisms. Such commonly used MoM driving schemes as the ports locally backed up by the vertical wall, ungrounded-internal differential ports or via-mounted ports can be accurately de-embedded within the framework of the VSOC.
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收藏
页码:303 / 306
页数:4
相关论文
共 3 条
[1]   On the network characterization of planar passive circuits using the method of moments [J].
Eleftheriades, GV ;
Mosig, JR .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (03) :438-445
[2]   Unified equivalent-circuit model of planar discontinuities suitable for field theory-based CAD and optimization of M(H)MIC's [J].
Zhu, L ;
Wu, K .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1999, 47 (09) :1589-1602
[3]   Comparative investigation on numerical de-embedding techniques for equivalent circuit modeling of lumped and distributed microstrip circuits [J].
Zhu, L ;
Wu, K .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2002, 12 (02) :51-53