Optimized plasma-polymerized fluoropolymer mask for local porous silicon formation

被引:6
作者
Lu, Bin [1 ]
Defforge, Thomas [1 ]
Fodor, Balint [1 ,2 ]
Morillon, Benjamin [3 ]
Alquier, Daniel [1 ]
Gautier, Gael [1 ]
机构
[1] Univ Tours, GREMAN, CNRS, UMR7347,INSA,CVL, 16 Rue Pierre & Marie Curie,BP 7155, F-37071 Tours 2, France
[2] Hungarian Acad Sci, Inst Tech Phys & Mat Sci, Energy Res Ctr, Konkoly Thege Miklos Ut 29-33, H-1121 Budapest, Hungary
[3] STMicroelectronics, 10 Rue Thales Milet CS 97155, F-37071 Tours 2, France
关键词
DEPOSITION; TECHNOLOGY; ETHYLENE; SURFACE; FILMS; MEMS;
D O I
10.1063/1.4953088
中图分类号
O59 [应用物理学];
学科分类号
摘要
Mass production of hybrid silicon/porous silicon substrates requires a simple, low-cost, and reliable patterning process to locally form porous regions on silicon wafers. An innovative masking technology based on plasma-polymerized fluoropolymer (PPFP) has been proposed as a promising candidate. However, the use of PPFP film on silicon substrate requires an adhesion promoter which may cause several side effects, including film peeling-off and pinhole formation. This work aims to improve the adhesion strength without using the adhesion promoter. The present study shows that, by adopting a hydrogen-terminated surface and an optimized gas precursor composition of 25/25 sccm CHF3/C2H4, good adhesion of PPFP to silicon is obtained before and during porous silicon formation. PPFP mask deposited at high pressure shows well-defined borders after anodization. Finally, an optimized PPFP-based patterning process is proposed. Published by AIP Publishing.
引用
收藏
页数:7
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