Integrating white- and black-box techniques for class-level regression testing

被引:9
作者
Beydeda, S [1 ]
Gruhn, V [1 ]
机构
[1] Univ Dortmund, Dept Comp Sci, D-44221 Dortmund, Germany
来源
25TH ANNUAL INTERNATIONAL COMPUTER SOFTWARE & APPLICATIONS CONFERENCE | 2001年
关键词
D O I
10.1109/CMPSAC.2001.960639
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In recent years, several techniques have been proposed for class-level regression testing. Most of these techniques focus either on white- or black-box testing, although an integrated approach can have several benefits. As similar tasks have to be carried out for both white- and black-box testing, an integrated approach can improve efficiency and cost effectiveness. This article explains a new approach for class-level regression testing, integrating existing techniques. Particularly, those of Rothermel et al. and Hong et al. for white-box regression testing and black-box testing, respectively, have been integrated into a single technique. The benefits of the resulting technique are shown by example.
引用
收藏
页码:357 / 362
页数:4
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