Surface structure analysis based on the exclusive use of the specular LEED spot -: a theoretical study

被引：4

作者：

Held, G ^{[1
]}

Steinrück, HP ^{[1
]}

机构：

[1] Univ Erlangen Nurnberg, D-91058 Erlangen, Germany

来源：

SURFACE SCIENCE | 2001年 / 490卷 / 03期

基金：

澳大利亚研究理事会;

关键词：

low energy electron diffraction (LEED); surface structure; morphology; roughness; and topography; electron-solid interactions; scattering; diffraction; single crystal surfaces;

D O I：

10.1016/S0039-6028(01)01327-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The exclusive use of the specularly reflected beam (the (0, 0) spot) may be a more practical way of collecting data for a LEED I-V structure analysis under certain experimental conditions. In this paper we discuss the special properties of the (0, 0) spot intensity and test its sensitivity towards structural changes for the model system CO/Ni(1 1 1) within the framework of a R factor analysis. It is found that the (0, 0) spot can, indeed, be used for a reliable structure determination if the energy range is increased by collecting data at different polar and azimuthal angles of incidence. The R factor contrast is. however, reduced with respect to a conventional LEED I-V analysis. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：274 / 284

页数：11

共 28 条

[1] LEED DATA REDUCTION METHOD - DESCRIPTION AND APPLICATION TO RELAXATION OF ALUMINUM (001) AND (110) SURFACES [J].