Cross-plane thermal diffusivity measurement of an operating vertical cavity surface emitting laser using thermoreflectance

被引：2

作者：

Farzaneh, M. ^{[1
]}

Harris, Alphonse F. ^{[1
]}

Lebovitz, Adam ^{[1
]}

机构：

[1] Denison Univ, Dept Phys & Astron, Granville, OH 43023 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 109卷 / 09期

关键词：

TEMPERATURE; WAVELENGTH; MICROSCOPY;

D O I：

10.1063/1.3581089

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Cross-plane thermal diffusivity of a GaAs/AlGaAs-based vertical cavity surface emitting laser (VCSEL) is measured under operating conditions and active heat sinking using a thermoreflectance technique. Perpendicular thermal diffusivity is determined from the measurements of phase difference between the heating source and the temperature as a function of temperature modulation frequency. The value of (1.22 +/- 0.23) x 10(-6) m(2)/s is obtained for thermal diffusivity, which is of the same order as previous values obtained on unbiased VCSEL structures. This is 10-14 times smaller than the corresponding bulk value. The reduction is attributed to the increase in phonon-boundary scattering in the multilayer structure of the VCSEL. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3581089]

引用

页数：3

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