Cross-plane thermal diffusivity measurement of an operating vertical cavity surface emitting laser using thermoreflectance

被引：2
作者：
Farzaneh, M. [1 ]
Harris, Alphonse F. [1 ]
Lebovitz, Adam [1 ]
机构：
[1] Denison Univ, Dept Phys & Astron, Granville, OH 43023 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2011年 / 109卷 / 09期
关键词：
TEMPERATURE; WAVELENGTH; MICROSCOPY;
D O I：
10.1063/1.3581089
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Cross-plane thermal diffusivity of a GaAs/AlGaAs-based vertical cavity surface emitting laser (VCSEL) is measured under operating conditions and active heat sinking using a thermoreflectance technique. Perpendicular thermal diffusivity is determined from the measurements of phase difference between the heating source and the temperature as a function of temperature modulation frequency. The value of (1.22 +/- 0.23) x 10(-6) m(2)/s is obtained for thermal diffusivity, which is of the same order as previous values obtained on unbiased VCSEL structures. This is 10-14 times smaller than the corresponding bulk value. The reduction is attributed to the increase in phonon-boundary scattering in the multilayer structure of the VCSEL. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3581089]
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页数：3
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