Runaway electron beams formed in atmospheric pressure air in a diode with dielectric films

被引:0
作者
Tarasenko, Victor F. [1 ,2 ]
Kostyrya, Igor' D. [1 ]
机构
[1] Inst High Current Elect, 2-3 Acad Ave, Tomsk 634055, Russia
[2] Natl Res Tomsk Polytech Univ, 30 Lenin Ave, Tomsk 634050, Russia
来源
INTERNATIONAL CONFERENCE ON ATOMIC AND MOLECULAR PULSED LASERS XIII | 2018年 / 10614卷
关键词
supershort avalanche electron beam (SAEB); runaway electrons; dielectric films in gas diode; atmospheric pressure air; VOLTAGE PULSES; DISCHARGES;
D O I
10.1117/12.2302421
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper reports on a study of a supershort avalanche electron beam (SAEB) formed in atmospheric pressure air in a diode with dielectric films. The study shows that the number of electrons downstream of an Al foil anode increases gradually as a dielectric film 50 mu m thick is shifted from cathode to anode. With a film 100 mu m thick placed at 3 mm from the cathode, the number of electrons decreases similar to 4 times, whereas their number with the same foil placed at 1 and 11 mm decreases by no more than 30 %. It is supposed that the dielectric at 3 mm from the cathode substantially influences the formation of an ionization wave and that increasing its thickness causes a rapid decrease in SAEB amplitude.
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页数:6
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