Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

被引：1

作者：

Citrin, PH ^{[1
]}

Northrup, PA ^{[1
]}

Atkins, RM ^{[1
]}

Glodis, PF ^{[1
]}

Niu, L ^{[1
]}

Marcus, MA ^{[1
]}

Jacobson, DC ^{[1
]}

机构：

[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

来源：

APPLICATIONS OF SYNCHROTRON RADIATION TECHNIQUES TO MATERIALS SCIENCE IV | 1998年 / 524卷

关键词：

D O I：

10.1557/PROC-524-251

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

引用

页码：251 / 257

页数：7

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