Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

被引:1
|
作者
Citrin, PH [1 ]
Northrup, PA [1 ]
Atkins, RM [1 ]
Glodis, PF [1 ]
Niu, L [1 ]
Marcus, MA [1 ]
Jacobson, DC [1 ]
机构
[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
关键词
D O I
10.1557/PROC-524-251
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.
引用
收藏
页码:251 / 257
页数:7
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