n-type conductivity in oxygen ion implanted nanocrystalline diamond films

被引:0
作者
Hu, X. J. [1 ]
Liu, H. J. [1 ]
Pan, J. P. [1 ]
Lu, L. P. [1 ]
机构
[1] Zhejiang Univ Technol, Coll Chem Engn & Mat Sci, Hangzhou, Zhejiang, Peoples R China
来源
INEC: 2010 3RD INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1 AND 2 | 2010年
关键词
ULTRANANOCRYSTALLINE DIAMOND;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanocrystalline diamond films were implanted by oxygen ion and annealed under different temperatures. The results show that the oxygen ion implanted nanocrystalline diamond films exhibit n-type conductivity when the annealing temperature is above 800 degrees C. The annealing stimulates the electrical activation of oxygen ion implanted diamond grains and grain boundaries. The origin of n-type conductivity and related mechanisms are discussed.
引用
收藏
页码:620 / 621
页数:2
相关论文
共 6 条
[1]   Transport properties of n-type ultrananocrystalline diamond films [J].
Beloborodov, I. S. ;
Zapol, P. ;
Gruen, D. M. ;
Curtiss, L. A. .
PHYSICAL REVIEW B, 2006, 74 (23)
[2]   Bonding structure in nitrogen doped ultrananocrystalline diamond [J].
Birrell, J ;
Gerbi, JE ;
Auciello, O ;
Gibson, JM ;
Gruen, DM ;
Carlisle, JA .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (09) :5606-5612
[3]   Structural and electrical characteristics of nitrogen-doped nanocrystalline diamond films prepared by CVD [J].
Hu, Qiang ;
Hirai, Makoto ;
Joshi, Rakesh K. ;
Kumar, Ashok .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 42 (02)
[4]   Weak localization in ultrananocrystalline diamond [J].
Mares, JJ ;
Hubík, P ;
Kristofik, J ;
Kindl, D ;
Fanta, M ;
Nesládek, M ;
Williams, O ;
Gruen, DM .
APPLIED PHYSICS LETTERS, 2006, 88 (09)
[5]   n-type semiconducting diamond by means of oxygen-ion implantation [J].
Prins, JF .
PHYSICAL REVIEW B, 2000, 61 (11) :7191-7194
[6]   Tight-binding molecular-dynamics simulation of impurities in ultrananocrystalline diamond grain boundaries [J].
Zapol, P ;
Sternberg, M ;
Curtiss, LA ;
Frauenheim, T ;
Gruen, DM .
PHYSICAL REVIEW B, 2002, 65 (04) :454031-4540311