Nanotomography for understanding materials degradation

被引：44

作者：

Hashimoto, T. ^{[1
]}

Zhou, X. ^{[1
]}

Luo, C. ^{[1
]}

Kawano, K. ^{[1
]}

Thompson, G. E. ^{[1
]}

Hughes, A. E. ^{[2
]}

Skeldon, P. ^{[1
]}

Withers, P. J. ^{[1
]}

Marrow, T. J. ^{[1
]}

Sherry, A. H. ^{[1
]}

机构：

[1] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

[2] CSIRO Mat Sci & Technol, Clayton, Vic 3169, Australia

来源：

SCRIPTA MATERIALIA | 2010年 / 63卷 / 08期

基金：

英国工程与自然科学研究理事会;

关键词：

Three-dimensional tomography; Scanning electron microscopy; Ultramicrotomy; Corrosion; STRESS-CORROSION CRACKING; ELECTRON-MICROSCOPY; TOMOGRAPHY;

D O I：

10.1016/j.scriptamat.2010.06.031

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The combination of ultramicrotomy and low-voltage scanning electron microscopy, with selective detection of backscattered electrons, significantly improved depth and lateral resolutions and atomic number contrast (Z-contrast) sensitivity, enabling high-resolution tomography of localized corrosion. This approach has advanced the understanding of the relationship between the distribution of S-phase particles and the initiation and development of localized corrosion, and the transition to intergranular corrosion in an AA2024-T3 aluminium alloy. Crown Copyright (C) 2010 Published by Elsevier Ltd. on behalf of Acta Materialia Inc. All rights reserved.

引用

页码：835 / 838

页数：4

共 15 条

[1] X-ray microtomographic observation of intergranular stress corrosion cracking in sensitised austenitic stainless steel [J].

Babout, L. ;

Marrow, T. J. ;

Engelberg, D. ;

Withers, P. J. .

MATERIALS SCIENCE AND TECHNOLOGY, 2006, 22 (09) :1068-1075

[2] Towards neural circuit reconstruction with volume electron microscopy techniques [J].

Briggman, Kevin L. ;

Denk, Winfried .

CURRENT OPINION IN NEUROBIOLOGY, 2006, 16 (05) :562-570

[3] Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging [J].

De Winter, D. A. Matthijs ;

Schneijdenberg, C. T. W. M. ;

Lebbink, M. N. ;

Lich, B. ;

Verkleij, A. J. ;

Drury, M. R. ;

Humbel, B. M. .

JOURNAL OF MICROSCOPY, 2009, 233 (03) :372-383

[4] APPLICATION OF ULTRAMICROTOMY TO ELECTRON-OPTICAL EXAMINATION OF SURFACE-FILMS ON ALUMINUM [J].

FURNEAUX, RC ;

THOMPSON, GE ;

WOOD, GC .

CORROSION SCIENCE, 1978, 18 (10) :853-&

[5]

Giannuzzi L. A., 2005, Introduction to focused ion beams: instrumentation, theory, techniques and practice

[6] Site-specific 3D imaging of cells and tissues with a dual beam microscope [J].

Heymann, Jurgen A. W. ;

Hayles, Mike ;

Gestmann, Ingo ;

Giannuzzi, Lucille A. ;

Lich, Ben ;

Subramaniam, Sriram .

JOURNAL OF STRUCTURAL BIOLOGY, 2006, 155 (01) :63-73

[7] Observations of intergranular stress corrosion cracking in a grain-mapped polycrystal [J].

King, A. ;

Johnson, G. ;

Engelberg, D. ;

Ludwig, W. ;

Marrow, J. .

SCIENCE, 2008, 321 (5887) :382-385

[8] Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling [J].

Knott, Graham ;

Marchman, Herschel ;

Wall, David ;

Lich, Ben .

JOURNAL OF NEUROSCIENCE, 2008, 28 (12) :2959-2964

[9] Nano-characterization of cast structures by FIB-tomography [J].

Lasagni, Fernando ;

Lasagni, Andres ;

Engstler, Michael ;

Degischer, Hans Peter ;

Muecklich, Frank .

ADVANCED ENGINEERING MATERIALS, 2008, 10 (1-2) :62-66

[10]

Maire E, 2001, ADV ENG MATER, V3, P539, DOI 10.1002/1527-2648(200108)3:8<539::AID-ADEM539>3.0.CO

← 1 2 →