Employing low-temperature barriers to achieve strain-relaxed and high-performance GaN-based LEDs

被引:11
作者
Lin, Zhiting [1 ,2 ]
Wang, Haiyan [1 ,2 ]
Wang, Wenliang [1 ,2 ]
Lin, Yunhao [1 ,2 ]
Yang, Meijuan [1 ,2 ]
Chen, Shuqi [1 ,2 ]
Li, Guoqiang [1 ,2 ,3 ]
机构
[1] S China Univ Technol, State Key Lab Luminescent Mat & Devices, Guangzhou 510640, Peoples R China
[2] S China Univ Technol, Engn Res Ctr Solid State Lighting & Its Informat, Guangzhou 510640, Peoples R China
[3] S China Univ Technol, Sch Mat Sci & Engn, Dept Elect Mat, Guangzhou 510640, Peoples R China
基金
中国国家自然科学基金;
关键词
MULTIPLE-QUANTUM WELLS; LIGHT-EMITTING-DIODES; III-NITRIDES; GROWTH; RELAXATION; DEPOSITION; STRESS; EFFICIENCY; SUBSTRATE; FILMS;
D O I
10.1364/OE.24.011885
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The epitaxial structure design of low-temperature barriers has been adopted to promote strain relaxation in multiple quantum well (MQWs) and achieve high-efficient GaN-based light-emitting diodes (LEDs). With these barriers, the relaxation value of wells increases from 0 to 4.59%. The strain-relaxed mechanism of low-temperature barriers is also discussed. The LED chip with the barriers grown at the TMIn flow of 75 sccm and the growth temperature of 830 degrees C has an optimal strain relaxation value of 1.53% in wells, and exhibits the largest light output power of 63.83 mW at the injection current of 65 mA, which is higher than that of conventional LED (51.89 mW) by 23%. In-depth studies reveal that the optimal low-temperature barriers remarkably promote the strain relaxation in wells without forming large density of crystalline defects. This achievement of high-efficiency LEDs sheds light on the future solid-state lighting applications. (C)2016 Optical Society of America
引用
收藏
页码:1885 / 1896
页数:12
相关论文
共 60 条
[1]   Effects of stress on the structure of indium-tin-oxide thin films grown by pulsed laser deposition [J].
Adurodija, FO ;
Izumi, H ;
Ishihara, T ;
Yoshioka, H ;
Motoyama, M .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2001, 12 (01) :57-61
[2]   Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1-xN films [J].
Angerer, H ;
Brunner, D ;
Freudenberg, F ;
Ambacher, O ;
Stutzmann, M ;
Hopler, R ;
Metzger, T ;
Born, E ;
Dollinger, G ;
Bergmaier, A ;
Karsch, S ;
Korner, HJ .
APPLIED PHYSICS LETTERS, 1997, 71 (11) :1504-1506
[3]   Elastic strain relaxation and piezoeffect in GaN-AlN, GaN-AlGaN and GaN-InGaN superlattices [J].
Bykhovski, AD ;
Gelmont, BL ;
Shur, MS .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :6332-6338
[4]   InGaN-GaN multiquantum-well blue and green light-emitting diodes [J].
Chang, SJ ;
Lai, WC ;
Su, YK ;
Chen, JF ;
Liu, CH ;
Liaw, UH .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (02) :278-283
[5]   Intrinsic stress generation and relaxation of plasma-enhanced chemical vapor deposited oxide during deposition and subsequent thermal cycling [J].
Chen, KS ;
Zhang, X ;
Lin, SY .
THIN SOLID FILMS, 2003, 434 (1-2) :190-202
[6]   High resolution x-ray analysis of pseudomorphic InGaN/GaN multiple quantum wells: Influence of Si doping concentration [J].
Cho, YH ;
Fedler, F ;
Hauenstein, RJ ;
Park, GH ;
Song, JJ ;
Keller, S ;
Mishra, UK ;
DenBaars, SP .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (05) :3006-3008
[7]   Influence of polarization fields on carrier lifetime and recombination rates in InGaN-based light-emitting diodes [J].
David, Aurelien ;
Grundmann, Michael J. .
APPLIED PHYSICS LETTERS, 2010, 97 (03)
[8]   High quantum efficiency InGaN/GaN multiple quantum well solar cells with spectral response extending out to 520 nm [J].
Farrell, R. M. ;
Neufeld, C. J. ;
Cruz, S. C. ;
Lang, J. R. ;
Iza, M. ;
Keller, S. ;
Nakamura, S. ;
DenBaars, S. P. ;
Mishra, U. K. ;
Speck, J. S. .
APPLIED PHYSICS LETTERS, 2011, 98 (20)
[9]   Microstructure and composition analysis of group III nitrides by X-ray scattering [J].
Fewster, PF ;
Andrew, NL ;
Foxon, CT .
JOURNAL OF CRYSTAL GROWTH, 2001, 230 (3-4) :398-404
[10]   Growth and Characterization of GaN/InGaN Multiple Quantum Wells on Nanoscale Epitaxial Lateral Overgrown Layers [J].
Fong, W. K. ;
Leung, K. K. ;
Surya, C. .
CRYSTAL GROWTH & DESIGN, 2011, 11 (06) :2091-2097