Testing the analytical model of the pyramid wavefront sensor with high-order aberrations on the optical bench

被引：0
|
作者：
Rosensteiner, Matthias [1 ]
Veran, Jean-Pierre [1 ]
机构：
[1] NRC Herzberg, Victoria, BC V9E 2E7, Canada
来源：
ADAPTIVE OPTICS SYSTEMS IV | 2014年 / 9148卷
关键词：
D O I：
10.1117/12.2056895
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The pyramid wavefront sensor (PWFS) is generally considered a better alternative to the widely used Shack-Hartmann wavefront sensor (SHWFS), due to the theoretically higher sensibility and increased resistance to aliasing. These properties, which stem from the duality of the PWFS as a slope/phase sensor, are very desirable, since they can lead to increased performance and higher sky coverage in AO systems. We have tried to verify these properties experimentally by using a 32x32 MEMS deformable mirror to create Fourier modes, which were presented to a prototype PWFS.
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