Coordination environment of silicon in silica glass up to 74 GPa:: An x-ray Raman scattering study at the silicon L edge

被引：35

作者：

Fukui, Hiroshi ^{[1
]}

Kanzaki, Masami ^{[1
]}

Hiraoka, Nozomu ^{[2
]}

Cai, Yong Q. ^{[2
]}

机构：

[1] Okayama Univ, Inst Study Earths Interior, Misasa, Tottori 6820193, Japan

[2] Natl Synchrotron Radiat Res Ctr, Hsinchu 30076, Taiwan

来源：

PHYSICAL REVIEW B | 2008年 / 78卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.78.012203

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Near-edge x-ray Raman scattering (XRS) spectra of the silicon L edge have been obtained on SiO(2) glass under compression in a diamond anvil cell up to 74 GPa. Partial densities of states (DOS's) of electrons, which the spectra reflect, have been calculated. The spectra for the glass do not show significant variations with pressure, whereas distinct differences are observed between quartz and stishovite, providing clear evidence for the nonexistence of sixfold-coordinated silicon by oxygen, that is stishovitelike silicon, in silica glass up to 74 GPa. A post main-edge hump, which is not seen in the XRS spectra and DOS's of quartz and stishovite, and an edge energy shift suggest that the silicon is in a different coordination environment under pressure. A compression mechanism of SiO(2) glass which involves the formation of fivefold-coordinated silicon following the decrease in Si-O-Si angle is proposed to explain the observed changes up to 74 GPa.

引用

页数：4

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[11] Cost-effective upgrade of a focusing system for inelastic X-ray scattering experiments under high pressure [J].