Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation

被引：18

作者：

Nagendran, R. ^{[1
]}

Thirumurugan, N. ^{[1
]}

Chinnasamy, N. ^{[1
]}

Janawadkar, M. P. ^{[1
]}

Baskaran, R. ^{[1
]}

Vaidhyanathan, L. S. ^{[1
]}

Sundar, C. S. ^{[1
]}

机构：

[1] Indira Gandhi Ctr Atom Res, Condensed Matter Phys Div, Mat Sci Grp, Kalpakkam 603102, Tamil Nadu, India

来源：

NDT & E INTERNATIONAL | 2010年 / 43卷 / 08期

关键词：

SQUID; Eddy current testing; Optimun excitation frequency; SYSTEM;

D O I：

10.1016/j.ndteint.2010.08.003

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NI)E) system The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14 mm below the top surface of the plate. The defect depth was varied in steps of 2 mm, while the overall total thickness of the stack of plates was kept constant at 15 mm Each defect represented a localized loss of conductor volume, which was 60 mm in length, 0.75 mm in width and 1 mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect. (C) 2010 Elsevier Ltd. All rights reserved.

引用

页码：713 / 717

页数：5