On the Use of Discrete Wavelets in Implementing Defect Detection System for Texture Images

被引:3
作者
Vaideliene, Gintare [1 ]
Valantinas, Jonas [1 ]
Razanskas, Petras [1 ]
机构
[1] Kaunas Univ Technol, Dept Appl Math, Studentu St 50, LT-51368 Kaunas, Lithuania
来源
INFORMATION TECHNOLOGY AND CONTROL | 2016年 / 45卷 / 02期
关键词
texture images; defect detection; discrete wavelet transforms; statistical data analysis; automatic visual inspection; INSPECTION; CLASSIFICATION;
D O I
10.5755/j01.itc.45.2.12654
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a novel wavelet-based approach to the detection of defects in grey-level texture images is proposed. This new approach (system) explores specific properties of the discrete wavelet transform (DWT), evaluates the statistical analysis results associated with well-defined and task-oriented subsets of DWT spectral coefficients, and generates defect detection criteria which, in their turn, evaluate many-sided nature of potential defects in texture images and leave space for controlling the risk, i.e. for controlling the percentage of false positives and/or false negatives in a particular class of texture images. The experimental results demonstrating the use of the proposed system for the visual inspection of ceramic tiles, obtained from the real factory environment, and textile fabric scraps are also presented.
引用
收藏
页码:214 / 222
页数:9
相关论文
共 32 条
  • [1] [Anonymous], 1988, IEEE INT C SYST MAN
  • [2] Fabric defect detection by Fourier analysis
    Chan, CH
    Pang, GKH
    [J]. IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2000, 36 (05) : 1267 - 1276
  • [3] Automated inspection of engineering ceramic grinding surface damage based on image recognition
    Chen, Shangong
    Lin, Bin
    Han, Xuesong
    Liang, Xiaohu
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2013, 66 (1-4) : 431 - 443
  • [4] Methodology for Automatic Process of the Fired Ceramic Tile's Internal Defect Using IR Images and Artificial Neural Network
    de Andrade, Roberto Marcio
    Eduardo, Alexandre Carlos
    [J]. JOURNAL OF THE BRAZILIAN SOCIETY OF MECHANICAL SCIENCES AND ENGINEERING, 2011, 33 (01) : 67 - 73
  • [5] Dobrescu R., 2007, INT J CIRCUITS SYSTE, V1, P79
  • [6] Elbehiery H, 2005, PROC WRLD ACAD SCI E, V5, P158
  • [7] Statistical approach to unsupervised defect detection and multiscale localization in two-texture images
    Gururajan, Arunkumar
    Sari-Sarraf, Harned
    Hequet, Eric F.
    [J]. OPTICAL ENGINEERING, 2008, 47 (02)
  • [8] Detection of defects in fabrics using topothesy fractal dimension features
    Hanmandlu, Madasu
    Choudhury, Dilip
    Dash, Sujata
    [J]. SIGNAL IMAGE AND VIDEO PROCESSING, 2015, 9 (07) : 1521 - 1530
  • [9] TEXTURAL FEATURES FOR IMAGE CLASSIFICATION
    HARALICK, RM
    SHANMUGAM, K
    DINSTEIN, I
    [J]. IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, 1973, SMC3 (06): : 610 - 621
  • [10] Automated defect detection in textured materials using wavelet-domain hidden Markov models
    Hu, Guang-Hua
    Zhang, Guo-Hui
    Wang, Qing-Hui
    [J]. OPTICAL ENGINEERING, 2014, 53 (09)