RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering

被引：19

作者：

Drogowska, K. ^{[1
,5
]}

Tarnawski, Z. ^{[1
]}

Brudnik, A. ^{[2
]}

Kusior, E. ^{[2
]}

Sokolowski, M. ^{[2
]}

Zakrzewska, K. ^{[2
]}

Reszka, A. ^{[3
]}

Kim-Ngan, N. -T. H. ^{[4
]}

Balogh, A. G. ^{[5
]}

机构：

[1] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland

[2] AGH Univ Sci & Technol, Fac Elect Engn Automat Comp Sci & Elect, PL-30059 Krakow, Poland

[3] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

[4] Pedag Univ, Inst Phys, PL-30084 Krakow, Poland

[5] Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany

来源：

MATERIALS RESEARCH BULLETIN | 2012年 / 47卷 / 02期

关键词：

Multilayers; Sputtering; X-ray diffraction; Crystal structure; Optical properties; TIO2; HYDROGEN; TRANSITION; NANOTUBES; ELECTRODE; OXIDE;

D O I：

10.1016/j.materresbull.2011.11.026

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Single-, bi- and tri-layered films of Ti-TiO2 system were deposited by d.c. pulsed magnetron sputtering from metallic Ti target in an inert Ar or reactive At + O-2 atmosphere. The nominal thickness of each layer was 50 nm. The chemical composition and its depth profile were determined by Rutherford backscattering spectroscopy (RBS). Crystallographic structure was analysed by means of X-ray diffraction (XRD) at glancing incidence. X-ray reflectometry (XRR) was used as a complementary method for the film thickness and density evaluation. Modelling of the optical reflectivity spectra of Ti-TiO2 thin films deposited onto Si(1 1 1) substrates provided an independent estimate of the layer thickness. The combined analysis of RBS, XRR and reflectivity spectra indicated the real thickness of each layer less than 50 nm with TiO2 film density slightly lower than the corresponding bulk value. Scanning Electron Microscopy (SEM) cross-sectional images revealed the columnar growth of TiO2 layers. Thickness estimated directly from SEM studies was found to be in a good agreement with the results of RBS, XRR and reflectivity spectra. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：296 / 301

页数：6

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