On Diagnosis of Violations of Constraints in Petri Net Models of Discrete Event Systems

被引:3
作者
Bordbar, Behzad [1 ]
Al-Ajeli, Ahmed [1 ]
Alodib, Mohammed [2 ]
机构
[1] Univ Birmingham, Sch Comp Sci, Birmingham B15 2TT, W Midlands, England
[2] Qassim Univ, Buraydah 51411, Qassim, Saudi Arabia
来源
2014 IEEE 26TH INTERNATIONAL CONFERENCE ON TOOLS WITH ARTIFICIAL INTELLIGENCE (ICTAI) | 2014年
关键词
DISTRIBUTED DIAGNOSIS; FAULT-DETECTION; DIAGNOSABILITY;
D O I
10.1109/ICTAI.2014.106
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Failure detection in partially observable model-based Discrete Event Systems requires modelling failures as unobservable events within the system. Representing failures as events is not always realistic. For example, some classes of failure are in form of violations of constraints such as Service Level Agreement (SLA) and Quality of Service (QoS). These forms of failures do not represent events by themselves. They have to be modelled as additional events. Modifying the plant model is not always acceptable. Firstly, this may make the models large, causing extra computational complexity. Secondly, adding extra transitions is not always acceptable from engineers' perspective, because these constraints may change over the time leading to alternations of models every time these constraints are changed. To address this issue, this paper presents a new definition of diagnosability which extends the existing definition. In the new definition, a formalism has been introduced which captures failures as logical constraints instead of events. We show that starting from a Petri net, if the failure is expressed in Yen's logic, we can create a new Petri net with additional transitions, including transitions modelling failure, such that detection of violation of the constraint in the first Petri net is converted to diagnosis of failure in the second.
引用
收藏
页码:673 / 680
页数:8
相关论文
共 50 条
  • [21] An effective approach for fault diagnosis of Discrete-Event Systems modeled as safe labeled Petri nets
    Bonafin, Ana C.
    Cabral, Felipe G.
    Moreira, Marcos, V
    [J]. CONTROL ENGINEERING PRACTICE, 2022, 123
  • [22] Diagnosis of Stochastic Discrete Event Systems Based on N-gram Models
    Yoshimoto, Miwa
    Kobayashi, Koichi
    Hiraishi, Kunihiko
    [J]. IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2015, E98A (02) : 618 - 625
  • [23] Distributed fault diagnosis using petri net reduced models
    Arámburo-Lizárraga, J
    López-Mellado, E
    Ramírez-Treviño, A
    [J]. INTERNATIONAL CONFERENCE ON SYSTEMS, MAN AND CYBERNETICS, VOL 1-4, PROCEEDINGS, 2005, : 702 - 707
  • [24] Overview of Fault Diagnosis Methods based on Petri Net Models
    Basile, Francesco
    [J]. 2014 EUROPEAN CONTROL CONFERENCE (ECC), 2014, : 2636 - 2642
  • [25] Distributed synchronous diagnosis of discrete event systems modeled as automata
    Veras, Maria Z. M.
    Cabral, Felipe G.
    Moreira, Marcos V.
    [J]. CONTROL ENGINEERING PRACTICE, 2021, 115
  • [26] Pattern diagnosis for stochastic discrete event systems
    Geng, Xuena
    Ouyang, Dantong
    Jiang, Zhengang
    [J]. ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE, 2020, 87 (87)
  • [27] Comparison of diagnosis approaches for Discrete Event Systems
    Philippot, Alexandre
    Carre-Menetrier, Veronique
    [J]. PROCEEDINGS OF INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND SYSTEMS MANAGEMENT (IESM'2011): INNOVATIVE APPROACHES AND TECHNOLOGIES FOR NETWORKED MANUFACTURING ENTERPRISES MANAGEMENT, 2011, : 1131 - 1140
  • [28] Decentralized failure diagnosis of discrete event systems
    Qiu, WB
    Kumar, R
    [J]. IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANS, 2006, 36 (02): : 384 - 395
  • [29] Asynchronous Fault Diagnosis of Discrete Event Systems
    White, Alejandro
    Karimoddini, Ali
    [J]. 2017 AMERICAN CONTROL CONFERENCE (ACC), 2017, : 3224 - 3229
  • [30] Synchronous Diagnosis of Discrete-Event Systems
    Cabral, Felipe Gomes
    Moreira, Marcos Vicente
    [J]. IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2020, 17 (02) : 921 - 932