High-precision laser-assisted absolute determination of x-ray diffraction angles

被引:22
作者
Kubicek, K. [1 ]
Braun, J. [1 ]
Bruhns, H. [1 ]
Lopez-Urrutia, J. R. Crespo [1 ]
Mokler, P. H. [1 ]
Ullrich, J. [1 ]
机构
[1] Max Planck Inst Nucl Phys, D-69117 Heidelberg, Germany
关键词
BEAM ION-TRAP; HIGH-FREQUENCY SPECTRA; ARGON RECOIL IONS; HELIUM-LIKE IONS; 1S LAMB SHIFT; WAVELENGTH MEASUREMENTS; CHARGED IONS; SPECTROSCOPY; ELEMENTS; PHYSICS;
D O I
10.1063/1.3662412
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines visible laser beams with the Bond method, where Bragg angles (theta and -theta) are determined without any x-ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1s2p P-1(1) -> 1s(2) S-1(0) w-line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1.5 ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two-photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision. (C) 2012 American Institute of Physics. [doi:10.1063/1.3662412]
引用
收藏
页数:8
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