Quantitative Characterization of Vertically Aligned Multi-Walled Carbon Nanotube Arrays Using Small Angle X-Ray Scattering

被引：16

作者：

Das, Narayan Ch ^{[1
,2
]}

Yang, Kaikun ^{[1
]}

Liu, Yayong ^{[1
]}

Sokol, Paul E. ^{[2
,3
]}

Wang, Zhigang ^{[4
]}

Wang, Howard ^{[1
]}

机构：

[1] SUNY Binghamton, Dept Mech Engn, Binghamton, NY 13902 USA

[2] Indiana Univ Ctr Explorat Energy & Matter, Bloomington, IN 47408 USA

[3] Indiana Univ, Dept Phys, Bloomington, IN 47408 USA

[4] Chinese Acad Sci, Inst Chem, Beijing Natl Lab Mol Sci, Beijing 100190, Peoples R China

来源：

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 2011年 / 11卷 / 06期

基金：

美国国家科学基金会;

关键词：

Small Angle X-ray Scattering; Carbon Nanotube Arrays; Alignment; CHEMICAL-VAPOR-DEPOSITION; FIELD-EMISSION; RAPID GROWTH; FILMS; MORPHOLOGY; NUCLEATION; FIBERS;

D O I：

10.1166/jnn.2011.4110

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We have used small angle X-ray scattering (SAXS) to quantitatively characterize the morphology of vertically aligned (VA) multiwall carbon nanotube (MWCNT) arrays. We examined the extent of alignment of MWCNTs in terms of order parameter by analyzing SAXS intensity as a function of azimuthal angle. The SAXS measurements at different heights of CNT arrays from the substrate reveal two distinct morphologies and increasing alignment. We are able to quantitatively characterize a real variation in CNT diameters of the VA-MWCNTs through model fitting of the SAXS spectra. It found that the average CNT diameter increases with increasing distance from the substrate.

引用

页码：4995 / 5000

页数：6

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